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机译：大型CMSμon阴极条室的老化测试
University of Florida, Gainesville, FL 32611, USA ( host institution ); Acosta, D. ( author ); Apollinari, G. ( author ); Arisaka, K. ( author ); Bondar, N. ( author ); Breedon, R. ( author ); Bujak, A. ( author ); Bylsma, B. ( author ); Chester, N. ( author ); Clare, R. ( author ); Cline, D. ( author ); Cousins, R. ( author ); Cox, T. ( author ); Dolinsky, S. ( author ); Durkin, S. ( author ); Eartly, D. ( author ); Ivanov, Yu. ( author ); Ferguson, T. ( author ); Gavrilov, G. ( author ); Gilmore, J. ( author ); Gu, J. ( author ); Gutay, L. ( author ); Hann, F. ( author ); Hartmut, R. ( author ); Hauser, J. ( author ); He, K. ( author ); Ignatenko, M. ( author ); Ilie, S. ( author ); Jiang, C. ( author ); Ko, W. ( author ); Korytov, A. ( author ); Krivshich, A. ( author ); Kuznetsova, K. ( author ); Layter, J. ( author ); Lee, R. ( author ); Levtchenko, P. ( author ); Ling, T.Y. ( author ); Loveless, D. ( author ); Lusin, S. ( author ); Maeshima, K. ( author ); Madorsky, A. ( author ); Matthey, C. ( author ); Matveev, M. ( author ); von der Mey, M. ( author ); Mitselmakher, G. ( author ); Otwinowski, S. ( author ); Padley, P. ( author ); Pal, I. ( author ); Pischalnikov, Yu. ( author ); Prokofiev, O. ( author ); Razmyslovich, V. ( author ); Reeder, D. ( author ); Roberts, J. ( author ); Schipunov, L. ( author ); Smirnov, I. ( author ); Souvorov, V. ( author ); Stasko, J. ( author ); Sun, H. ( author ); Sytnik, V. ( author ); Terentyev, N. ( author ); Tripathi, M. ( author ); Vavilov, S. ( author ); Volkov, S. ( author ); Vorobyov, A. ( author ); Vorobyov, I. ( author ); Wang, L. ( author ); Yarba, V. ( author ); Zhou, L. ( author ); Zhu, Z. ( author );
机译：CMS阴极带室介子系统的Level-1触发器的原型区域寻轨器的开发和测试
机译：带有CRAFT08数据的CMS ME1 / 1介子站阴极条室的空间分辨率
机译：CMS Muon系统阴极剥离室的性能验证测试
机译：对CMS端帽muon触发系统的muon端口卡和相关电子设备进行测试。
机译：试剂条检验诊断血吸虫病的循环阴极抗原
机译：全尺寸Cms muon阴极带室的老化试验
机译：复杂的船舶武器硬件复合体全尺寸测试的测试台以及复杂的船舶武器硬件复合体全尺寸测试的分析，开发和制备方法
机译：可用于将测试主体安装到位置的杰克装置和用于测试大型飞机结构的姿势控制装置的杰克，能够简单，手动地调整长度
机译：用于软包装（尤其是食品包装或药品包装）的密封性测试设备具有用于引入软包装的测试室，该设备可调节测试室中定义的高压水平
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